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Memory test and burn-in for 5G development labs

Photo by: Electronics weekly

Advantest’s H5620ES engineering test system is designed for burn-in and core testing of DDR4, DDR5 and LPDDR devices in laboratory environments. “Like its sister system, the H5620 production unit, the new tester parallel tests both DDR4 and DDR5 memories. It can accommodate memory ICs with 100MHz frequencies and 200Mbit/s data rates,” said the company, adding ... This story continues at Memory test...

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